Open AccessUse of a hexapod in diffraction measurements of substrate‐supported crystals of organic semiconductors
Author(s) -
Yang Lin,
Yang Hoichang
Publication year - 2009
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049509037911
Subject(s) - pentacene , diffractometer , materials science , diffraction , hexapod , organic semiconductor , optics , crystallite , anisotropy , crystal (programming language) , substrate (aquarium) , crystallography , optoelectronics , crystal structure , chemistry , physics , nanotechnology , computer science , programming language , oceanography , robot , layer (electronics) , artificial intelligence , geology , metallurgy , thin film transistor
Thin films of organic semiconductor prepared on substrates generally contain crystals that have one common crystal plane parallel to the substrate but random in‐plane orientations. In diffraction measurements of these structures, it is often required to anchor the X‐ray beam on a fixed spot on the sample, such as an optically visible crystallite or island. Here, a hexapod is used in place of a traditional multi‐circle diffractometer to perform area‐detector‐based diffraction measurements on an actual device that contains 6,13‐bis(triisopropylsilyethynyl)‐pentacene (TIPS‐pentacene) crystals. The hexapod allows for sample rotations about any user‐defined rotation center. Two types of complex sample motions have been programmed to characterize the structure of the TIPS‐pentacene crystal: an in‐plane powder average has been performed at a fixed grazing‐incident angle to determine the lattice parameters of the crystal; then the in‐plane component of the scattering vector was continuously rotated in transmission geometry to determine the local crystal orientation.