Open AccessSynchrotron study of oxygen depletion in a Bi‐2212 whisker annealed at 363 K
Author(s) -
Cagliero Stefano,
Piovano Andrea,
Lamberti Carlo,
Rahman Khan Mohammad Mizanur,
Agostino Angelo,
Agostini Giovanni,
Gianolio Diego,
Mino Lorenzo,
Sans Juan A.,
Manfredotti Chiara,
Truccato Marco
Publication year - 2009
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049509036802
Subject(s) - whisker , synchrotron radiation , whiskers , materials science , annealing (glass) , electrical resistivity and conductivity , synchrotron , oxygen , analytical chemistry (journal) , single crystal , diffraction , crystallography , chemistry , metallurgy , composite material , optics , physics , electrical engineering , organic chemistry , chromatography , engineering
Direct evidence is reported of structural and electronic effects induced on a single Bi 2 Sr 2 CaCu 2 O 8+δ (Bi‐2212) whisker during a progressive annealing process. The crystal was investigated by micro X‐ray diffraction (µ‐XRD), micro X‐ray fluorescence and electrical characterization at the European Synchrotron Radiation Facility, during a series of three in situ thermal processes at 363 K. Each step increased the sample resistivity and decreased its critical temperature, up to a semiconducting behaviour. These data correlate with µ‐XRD analysis, which shows an increase of the c ‐axis parameter from 30.56 Å to 30.75 Å, indicating an oxygen depletion mechanism. Mild temperature annealing could be an effective process to modulate the intrinsic Josephson junctions' characteristics in Bi‐2212 whiskers.