Open AccessLinear polarization scans for resonant X‐ray diffraction with a double‐phase‐plate configuration
Author(s) -
Scagnoli Valerio,
Mazzoli Claudio,
Detlefs Carsten,
Bernard Pascal,
Fondacaro Andrea,
Paolasini Luigi,
Fabrizi Federica,
De Bergevin Francois
Publication year - 2009
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049509035006
Subject(s) - optics , diffractometer , polarization (electrochemistry) , materials science , diffraction , quadrupole , phase (matter) , linear polarization , physics , atomic physics , chemistry , laser , scanning electron microscope , quantum mechanics
An in‐vacuum double‐phase‐plate diffractometer for performing polarization scans combined with resonant X‐ray diffraction experiments is presented. The use of two phase plates enables the correction of some of the aberration effects owing to the divergence of the beam and its energy spread. A higher rate of rotated polarization is thus obtained in comparison with a system with only a single retarder. Consequently, thinner phase plates can be used to obtain the required rotated polarization rate. These results are particularly interesting for applications at low energy ( e.g. 4 keV) where the absorption owing to the phase plate(s) plays a key role in the feasibility of these experiments. Measurements by means of polarization scans at the uranium M 4 edge on UO 2 enable the contributions of the magnetic and quadrupole ordering in the material to be disentangled.