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Phonon spectroscopy at high pressure by inelastic X‐ray scattering
Author(s) -
Giordano Valentina M.,
Krisch Michael,
Monaco Giulio
Publication year - 2009
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049509033743
Subject(s) - phonon , diamond anvil cell , inelastic scattering , high pressure , spectroscopy , scattering , dispersion (optics) , diamond , high resolution , materials science , physics , optics , condensed matter physics , engineering physics , geology , remote sensing , quantum mechanics , composite material
The current status of phonon‐dispersion studies at high pressure using very high energy resolution inelastic X‐ray scattering is discussed. A brief description of the instrumental apparatus is given, together with an illustration of the high‐pressure facilities available at the IXS beamlines ID16 and ID28 of the ESRF. Some selected examples of recent studies on crystalline and liquid samples in a diamond anvil cell are then presented.

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