Open AccessIndividual GaAs nanorods imaged by coherent X‐ray diffraction
Author(s) -
Biermanns Andreas,
Davydok Anton,
Paetzelt Hendrik,
Diaz Ana,
Gottschalch Volker,
Metzger Till Hartmut,
Pietsch Ullrich
Publication year - 2009
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049509032889
Subject(s) - nanorod , diffraction , optics , x ray crystallography , materials science , x ray , physics , optoelectronics , nanotechnology
Using scanning X‐ray diffraction microscopy with a spot size of 220 × 600 nm, it was possible to inspect individual GaAs nanorods grown seed‐free through circular openings in a SiN x mask in a periodic array with 3 µm spacing on GaAs[111]B. The focused X‐ray beam allows the determination of the strain state of individual rods and, in combination with coherent diffraction imaging, it was also possible to characterize morphological details. Rods grown either in the centre or at the edge of the array show significant differences in shape, size and strain state.