Open AccessX‐ray diffractometry for the structure determination of a submicrometre single powder grain
Author(s) -
Yasuda Nobuhiro,
Murayama Haruno,
Fukuyama Yoshimitsu,
Kim Jungeun,
Kimura Shigeru,
Toriumi Koshiro,
Tanaka Yoshihito,
Moritomo Yutaka,
Kuroiwa Yoshihiro,
Kato Kenichi,
Tanaka Hitoshi,
Takata Masaki
Publication year - 2009
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904950900675x
Subject(s) - x ray , materials science , crystallography , chemistry , optics , physics
A high‐precision diffractometer has been developed for the structure analysis of a submicrometre‐scale single grain of a powder sample at the SPring‐8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of the diffractometer, which allows accurate diffraction intensity data of a submicrometre‐scale single powder grain to be measured. The phase zone plate was designed to create a high‐flux focused synchrotron radiation beam. A low‐eccentric goniometer and high‐precision sample positioning stages were adopted to ensure the alignment of a micrometre‐scale focused synchrotron radiation beam onto the submicrometre‐scale single powder grain. In order to verify the diffractometer performance, the diffraction pattern data of several powder grains of BaTiO 3 , of dimensions ∼600 × 600 × 300 nm, were measured. By identifying the diffraction data set of one single powder grain, the crystal structure was successfully determined with a reliable factor of 5.24%.