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High‐resolution spectroscopy on an X‐ray absorption beamline
Author(s) -
Hazemann JeanLouis,
Proux Olivier,
Nassif Vivian,
Palancher Hervé,
Lahera Eric,
Da Silva Cécile,
Braillard Aurélien,
Testemale Denis,
Diot MarieAnge,
Alliot Isabelle,
Del Net William,
Manceau Alain,
Gélébart Frédéric,
Morand Marc,
Dermigny Quentin,
Shukla Abhay
Publication year - 2009
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049508043768
Subject(s) - beamline , spectrometer , optics , synchrotron radiation , synchrotron , spectroscopy , absorption (acoustics) , scattering , absorption spectroscopy , materials science , resolution (logic) , bent molecular geometry , physics , beam (structure) , computer science , quantum mechanics , artificial intelligence , composite material
A bent‐crystal spectrometer based on the Rowland circle geometry has been installed and tested on the BM30b/FAME beamline at the European Synchrotron Radiation Facility to improve its performances. The energy resolution of the spectrometer allows different kinds of measurements to be performed, including X‐ray absorption spectroscopy, resonant inelastic X‐ray scattering and X‐ray Raman scattering experiments. The simplicity of the experimental device makes it easily implemented on a classical X‐ray absorption beamline. This improvement in the fluorescence detection is of particular importance when the probed element is embedded in a complex and/or heavy matrix, for example in environmental sciences.

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