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Obtaining local reciprocal lattice vectors from finite‐element analysis
Author(s) -
Sutter John P.,
Connolley Thomas,
Hill Tim P.,
Huang Houcheng,
Sharp Doug W.,
Drakopoulos Michael
Publication year - 2008
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904950802801x
Subject(s) - wiggler , monochromator , beamline , finite element method , bent molecular geometry , reciprocal lattice , synchrotron radiation , workbench , diffraction , software , deformation (meteorology) , structural engineering , optics , physics , materials science , mechanical engineering , computer science , beam (structure) , engineering , composite material , wavelength , quantum mechanics , cathode ray , visualization , programming language , electron
Finite‐element analysis is frequently used by engineers at synchrotron beamlines to calculate the elastic deformation of a single crystal undergoing mechanical bending or thermal load. ANSYS ® Workbench™ software is widely used for such simulations. However, although ANSYS ® Workbench™ software provides useful information on the displacements, strains and stresses within the crystal, it does not yield the local reciprocal lattice vectors that would be required for X‐ray diffraction calculations. To bridge this gap, a method based on the shape functions and interpolation procedures of the software itself has been developed. An application to the double‐crystal bent Laue monochromator being designed for the I12 (JEEP) wiggler beamline at the Diamond Light Source is presented.

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