A new  FEFF ‐based wavelet for EXAFS data analysis | Zendy

Funke Harald | Zendy; Chukalina Marina | Zendy; Scheinost Andreas C. | Zendy

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A new FEFF ‐based wavelet for EXAFS data analysis

Author(s) -

Funke Harald,

Chukalina Marina,

Scheinost Andreas C.

Publication year - 2007

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049507031901

Subject(s) - extended x ray absorption fine structure , wavelet , materials science , physics , analytical chemistry (journal) , optics , chemistry , computer science , absorption spectroscopy , artificial intelligence , chromatography

A new mother wavelet function for extended X‐ray absorption fine‐structure (EXAFS) data analysis has been designed, combining a model EXAFS function derived from the ab initio EXAFS code FEFF 8.20 and the complex Morlet wavelet. This new FEFF –Morlet mother wavelet routine allows the generation of wavelets well adapted to specific EXAFS problems. A substantial gain in resolution of the wavelet ridges in k and r space is achieved. The method is applied to a structural problem of Zn–Al double‐layer hydroxides, demonstrating unequivocally the homogeneity of the metal cation distribution in the hydroxide layers.

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