Open AccessRay‐trace calculations for in situ X‐ray beam imaging
Author(s) -
Kyele Nicholas R.,
Van Silfhout Roelof G.
Publication year - 2007
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049507029664
Subject(s) - synchrotron radiation , synchrotron , beam (structure) , optics , trace (psycholinguistics) , materials science , position (finance) , physics , philosophy , linguistics , finance , economics
A two‐dimensional beam‐position and profile monitor for synchrotron X‐ray beamlines was recently presented that was based on the principle of collection of scattered radiation from a thin polyimide foil. This paper presents a simple ray‐trace model of the device, which can be used as a tool to calculate its response to changes in various device geometrical properties for a given beam size. The tool provides a quick way of predicting positional sensitivity, beam profile shape and intensity distribution. The theoretically obtained beam images are compared with data obtained from experiments carried out at the European Synchrotron Radiation Facility.