Open AccessProbing atomic displacements with thermal differential EXAFS
Author(s) -
Ruffoni M. P.,
Pettifer R. F.,
Pascarelli S.,
Trapananti A.,
Mathon O.
Publication year - 2007
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049507028452
Subject(s) - extended x ray absorption fine structure , atomic absorption spectroscopy , materials science , sensitivity (control systems) , analytical chemistry (journal) , differential (mechanical device) , thermal , strain (injury) , atomic physics , chemistry , crystallography , physics , optics , absorption spectroscopy , thermodynamics , medicine , chromatography , quantum mechanics , electronic engineering , engineering
Differential extended X‐ray absorption fine structure (DiffEXAFS) is a novel technique for the study of small atomic strains. Here the development of this technique to the measurement of thermally induced strain is presented. Thermal DiffEXAFS measurements have been performed on α‐Fe and SrF 2 , yielding α = (11.6 ± 0.4) × 10 −6 K −1 and (19 ± 2) × 10 −6 K −1 , respectively. These are in good agreement with accepted values, proving the viability of the technique. Analysis has revealed sensitivity to mean atomic displacements of 0.3 fm.