Open AccessVerifying DiffEXAFS measurements with differential X‐ray diffraction
Author(s) -
Ruffoni M. P.,
Pettifer R. F.,
Pascarelli S.,
Mathon O.
Publication year - 2007
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049506049971
Subject(s) - differential (mechanical device) , diffraction , x ray crystallography , extended x ray absorption fine structure , thermal expansion , differential thermal analysis , x ray , physics , materials science , computational physics , analytical chemistry (journal) , optics , chemistry , thermodynamics , absorption spectroscopy , chromatography
Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale. Here a complementary technique for such studies is presented: differential X‐ray diffraction (DiffXRD), which may be used to independently verify DiffEXAFS results whilst using exactly the same experimental apparatus and measurement technique. A test experiment has been conducted to show that DiffXRD can be used to successfully determine the thermal expansion coefficient of SrF 2 .