Open AccessThree‐dimensional visualization of the inner structure of single crystals by step‐scanning white X‐ray section topography
Author(s) -
Mukaide Taihei,
Kajiwara Kentaro,
Noma Takashi,
Takada Kazuhiro
Publication year - 2006
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904950603384x
Subject(s) - perpendicular , optics , materials science , scintillator , cross section (physics) , crystal (programming language) , plane (geometry) , stacking , physics , detector , geometry , nuclear magnetic resonance , mathematics , quantum mechanics , computer science , programming language
Visualization of the three‐dimensional distribution of the crystal defects of large single crystals of calcium fluoride has been demonstrated by white X‐ray section topography using sheet‐like X‐rays (BL28B2 at SPring‐8). An image of the three‐dimensional distribution of the crystal defects was reconstructed by stacking section topographs, which expressed the images of cross sections of the sample. The section topographs were recorded using a CMOS flat‐panel imager or a CCD detector combined with scintillator (Gd 2 O 2 S:Tb) and relay lens system. The section topographs were measured by repeating cycles of exposure and sample translation along the direction perpendicular to the top face of the sample. Using high‐brilliance and high‐energy white X‐rays (∼60 keV) efficiently, visualization of the three‐dimensional structure of subgrains of a sample of up to 60 mm in diameter was achieved. Furthermore, the three‐dimensional distribution of the glide plane in the crystal was visualized by reconstructing the linear contrast of the glide plane.