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X‐ray optics for liquid surface/interface spectrometers
Author(s) -
Honkimäki V.,
Reichert H.,
Okasinski J. S.,
Dosch H.
Publication year - 2006
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049506031438
Subject(s) - beamline , synchrotron radiation , optics , x ray optics , diffraction , spectrometer , advanced photon source , synchrotron , synchrotron radiation source , interface (matter) , momentum transfer , physics , perpendicular , surface (topology) , x ray , materials science , beam (structure) , scattering , surface tension , geometry , gibbs isotherm , mathematics , quantum mechanics
A new X‐ray optics which enables precise structural investigations of liquid surfaces/interfaces is introduced. The new device is based on the use of high‐energy microbeams and gives access to large momentum transfer values perpendicular to the liquid surface/interface. The performance of a prototype of this new optics, which has been constructed and implemented at the high‐energy diffraction beamline ID15A at the European Synchrotron Radiation Source, is demonstrated.

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