Open AccessOn the use of CCD area detectors for high‐resolution specular X‐ray reflectivity
Author(s) -
Fenter P.,
Catalano J. G.,
Park C.,
Zhang Z.
Publication year - 2006
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049506018000
Subject(s) - specular reflection , optics , detector , scintillator , signal (programming language) , materials science , resolution (logic) , angular resolution (graph drawing) , repeatability , physics , chemistry , computer science , programming language , mathematics , chromatography , combinatorics , artificial intelligence
The use and application of charge coupled device (CCD) area detectors for high‐resolution specular X‐ray reflectivity is discussed. Direct comparison of high‐resolution specular X‐ray reflectivity data measured with CCD area detectors and traditional X‐ray scintillator (`point') detectors demonstrates that the use of CCD detectors leads to a substantial (∼30‐fold) reduction in data acquisition rates because of the elimination of the need to scan the sample to distinguish signal from background. The angular resolution with a CCD detector is also improved by a factor of ∼3. The ability to probe the large dynamic range inherent to high‐resolution X‐ray reflectivity data in the specular reflection geometry was demonstrated with measurements of the orthoclase (001)– and α‐Al 2 O 3 (012)–water interfaces, with measured reflectivity signals varying by a factor of ∼10 6 without the use of any beam attenuators. Statistical errors in the reflectivity signal are also derived and directly compared with the repeatability of the measurements.