
Multilayer X‐ray optics at CHESS
Author(s) -
Kazimirov Alexander,
Smilgies DetlefM.,
Shen Qun,
Xiao Xianghui,
Hao Quan,
Fontes Ernest,
Bilderback Donald H.,
Gruner Sol M.,
Platonov Yuriy,
Martynov Vladimir V.
Publication year - 2006
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049506002846
Subject(s) - x ray optics , optics , physical optics , synchrotron , diffraction , radius , resolution (logic) , silicon , physics , substrate (aquarium) , materials science , optoelectronics , x ray , computer science , artificial intelligence , computer security , oceanography , geology
Almost half of the X‐ray beamlines at the Cornell High Energy Synchrotron Source (CHESS) are based on multilayer optics. `Traditional' multilayers with an energy resolution of Δ E / E ≃ 2% are routinely used to deliver X‐ray flux enhanced by a factor of 10 2 in comparison with standard Si(111) optics. Sagittal‐focusing multilayers with fixed radius provide an additional factor of 10 gain in flux density. High‐resolution multilayer optics with Δ E / E ≃ 0.2% are now routinely used by MacCHESS crystallographers. New wide‐bandpass multilayers with Δ E / E = 5% and 10% have been designed and tested for potential applications in macromolecular crystallography. Small d ‐spacing multilayers with d ≤ 20 Å have been successfully used to extend the energy range of multilayer optics. Analysis of the main characteristics of the Mo/B 4 C and W/B 4 C small d ‐spacing multilayer optics shows enhancement in their performance at higher energies. Chemical vapour deposited SiC, with a bulk thermal conductivity of a factor of two higher than that of silicon, has been successfully introduced as a substrate material for multilayer optics. Characteristics of different types of multilayer optics at CHESS beamlines and their applications in a variety of scattering, diffraction and imaging techniques are discussed.