Open AccessA new approach to measuring high‐resolution magnetic Compton profiles
Author(s) -
Kawata H.,
Sakurai H.,
Shiotani N.,
Watanabe Y.
Publication year - 2006
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505040562
Subject(s) - physics , photon , polarization (electrochemistry) , compton scattering , reversing , detector , magnetic field , optics , materials science , chemistry , quantum mechanics , composite material
It is demonstrated that long‐term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid‐state detector and the traditional method of reversing the external magnetic field or the handedness of the polarization of incident photons in an asynchronous cycle with a short period of tens to hundreds of seconds.