A wide‐aperture dynamically focusing sagittal monochromator for X‐ray spectroscopy and diffraction | Zendy

Bilsborrow R. L. | Zendy; Atkinson P. A. | Zendy; Bliss N. | Zendy; Dent A. J. | Zendy; Dobson B. R. | Zendy; Stephenson P. C. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

A wide‐aperture dynamically focusing sagittal monochromator for X‐ray spectroscopy and diffraction

Author(s) -

Bilsborrow R. L.,

Atkinson P. A.,

Bliss N.,

Dent A. J.,

Dobson B. R.,

Stephenson P. C.

Publication year - 2006

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049505036903

Subject(s) - monochromator , wiggler , beamline , optics , monochromatic color , spectroscopy , full width at half maximum , diffraction , aperture (computer memory) , flux (metallurgy) , physics , synchrotron , materials science , wavelength , nuclear physics , beam (structure) , quantum mechanics , cathode ray , acoustics , metallurgy , electron

A scanning dynamically focusing sagittal X‐ray monochromator accepting 7 mrad of the fan from a 6 T wiggler is in routine use on beamline 16.5 (ultra‐dilute spectroscopy) of the SRS at CCLRC Daresbury Laboratory, UK. The energy range covered is 7–27 keV, with a horizontal spot size of <1.1 mm FWHM. Measured monochromatic flux from a Si 220 crystal pair is 1 × 10 11 photons s −1 (100 mA) −1 at 9 keV. This level of flux, usually associated with an insertion device on a third‐generation source, permits collection of EXAFS data on concentrations at or below 10 ppm.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research