Open AccessA wide‐aperture dynamically focusing sagittal monochromator for X‐ray spectroscopy and diffraction
Author(s) -
Bilsborrow R. L.,
Atkinson P. A.,
Bliss N.,
Dent A. J.,
Dobson B. R.,
Stephenson P. C.
Publication year - 2006
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505036903
Subject(s) - monochromator , wiggler , beamline , optics , monochromatic color , spectroscopy , full width at half maximum , diffraction , aperture (computer memory) , flux (metallurgy) , physics , synchrotron , materials science , wavelength , nuclear physics , beam (structure) , quantum mechanics , cathode ray , acoustics , metallurgy , electron
A scanning dynamically focusing sagittal X‐ray monochromator accepting 7 mrad of the fan from a 6 T wiggler is in routine use on beamline 16.5 (ultra‐dilute spectroscopy) of the SRS at CCLRC Daresbury Laboratory, UK. The energy range covered is 7–27 keV, with a horizontal spot size of <1.1 mm FWHM. Measured monochromatic flux from a Si 220 crystal pair is 1 × 10 11 photons s −1 (100 mA) −1 at 9 keV. This level of flux, usually associated with an insertion device on a third‐generation source, permits collection of EXAFS data on concentrations at or below 10 ppm.