Open AccessCharacterization of X‐ray area detectors for synchrotron beamlines
Author(s) -
Ponchut Cyril
Publication year - 2006
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505034278
Subject(s) - detector , characterization (materials science) , synchrotron , x ray detector , computer science , optics , synchrotron radiation , medical physics , physics , set (abstract data type) , field (mathematics) , mathematics , pure mathematics , programming language
In order to deal with the problem of quantitative and consistent evaluation of two‐dimensional X‐ray detectors at synchrotron beamlines, the methodology for X‐ray area detector characterization is reviewed. It is based on the definition of a minimum yet complete set of imaging parameters able to describe any kind of two‐dimensional detector regardless of its operating range, field of application and detecting principle. Measuring and derivation methods are reviewed for each parameter. Imaging parameters are to a large extent directly exploitable to assess the performance of a detector for any scientific application. Imaging characterization aims at helping two‐dimensional detector developers and two‐dimensional detector users in defining or choosing the device best suited for a given application, based on quantitative arguments.