Open AccessQuantitative high‐pressure pair distribution function analysis
Author(s) -
Parise John B.,
Antao Sytle M.,
Michel F. Marc,
Martin C. David,
Chupas Peter J.,
Shastri Sarvjit D.,
Lee Peter L.
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505022612
Subject(s) - beamline , diamond anvil cell , synchrotron radiation , pair distribution function , advanced photon source , synchrotron , scattering , brightness , rietveld refinement , materials science , high energy x rays , distribution function , high pressure , photon , optics , diffraction , physics , engineering physics , thermodynamics , beam (structure) , quantum mechanics
The collection of scattering data at high pressure and temperature is now relatively straightforward thanks to developments at high‐brightness synchrotron radiation facilities. Reliable data from powders, that are suitable for structure determination and Rietveld refinement, are routinely collected up to about 30 GPa in either a large‐volume high‐pressure apparatus or diamond anvil cell. In those cases where the total elastic scattering is of interest, as it is in the case of nano‐crystalline and glassy materials, technical developments, including the use of focused high‐energy X‐rays (>80 keV), are advantageous. Recently completed experiments on nano‐crystalline materials at the 1‐ID beamline at the Advanced Photon Source suggest that quantitative data, suitable for pair distribution function analysis, can be obtained.