Open AccessPerformance of a dispersion‐compensating scanning X‐ray spectrometer for Compton profile measurements
Author(s) -
Hiraoka N.,
Buslaps T.,
Honkimäki V.,
Suortti P.
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505022569
Subject(s) - spectrometer , monochromator , analyser , optics , synchrotron radiation , bent molecular geometry , synchrotron , beamline , high energy x rays , resolution (logic) , physics , dispersion (optics) , wavelength , momentum (technical analysis) , x ray spectroscopy , spectroscopy , materials science , beam (structure) , quantum mechanics , finance , artificial intelligence , computer science , economics , composite material
A new X‐ray spectrometer has been constructed for Compton profile measurements at beamline ID15B of the ESRF. The spectrometer is based on a novel idea, dispersion compensation, which was proposed earlier. A cylindrically bent Laue monochromator focuses ∼90 keV synchrotron radiation at about 0.7 m before the sample, and produces a well defined energy or wavelength gradient on the sample. A cylindrically bent Laue analyser almost perfectly compensates this wavelength gradient. Using an Al sample, it has been confirmed that the new spectrometer improves the counting rate by a factor of two compared with the previously constructed 30 keV and 60 keV spectrometers, with a comparable momentum resolution. Because of reduced absorption owing to use of high‐energy X‐rays, the enhancement of the counting rate is spectacular for heavy‐element materials.