Open AccessAn in situ and operando X‐ray absorption spectroscopy setup for measuring sub‐monolayer model and powder catalysts
Author(s) -
Weiher Norbert,
Bus Eveline,
Gorzolnik Blazej,
Möller Martin,
Prins Roel,
Van Bokhoven Jeroen Anton
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505020261
Subject(s) - extended x ray absorption fine structure , monolayer , catalysis , materials science , absorption (acoustics) , absorption spectroscopy , in situ , analytical chemistry (journal) , characterization (materials science) , wafer , spectroscopy , x ray absorption spectroscopy , chemical engineering , chemistry , nanotechnology , optics , organic chemistry , composite material , physics , engineering , quantum mechanics
A new spectroscopic cell has been designed for studying model catalysts using in situ or operando X‐ray absorption spectroscopy. The setup allows gas treatment and can be used between 100 and 870 K. Pressures from 10 −3 Pa up to 300 kPa can be applied. Measurements on model systems in this particular pressure range are a valuable extension of the commonly used UHV characterization techniques. Using this setup, we were able to analyze the Au L 3 EXAFS of a silica wafer covered with sub‐monolayer concentrations of gold (0.05 ML). By modifying the sample holder, powder catalysts can also be analyzed under plug‐flow conditions. As an example, the reduction of a Au/SiO 2 powder catalyst prepared from HAuCl 4 was followed.