Open AccessDetermination of the dynamic deformation tensor by time‐resolved triple‐crystal diffractometry
Author(s) -
Hayashi Yujiro,
Tsukuda Noboru,
Kuramoto Eiichi,
Tanaka Yoshihito,
Ishikawa Tetsuya
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505017280
Subject(s) - materials science , oscilloscope , optics , laser , wafer , gallium arsenide , tensor (intrinsic definition) , physics , optoelectronics , detector , geometry , mathematics
Triple‐crystal X‐ray diffractometry has been combined with time‐resolved measurement techniques. A simple time‐resolved technique was employed by using a digital storage oscilloscope and a fast X‐ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized convex surface. Time‐resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.