
On the refinement of time‐resolved diffraction data: comparison of the random‐distribution and cluster‐formation models and analysis of the light‐induced increase in the atomic displacement parameters
Author(s) -
Vorontsov Ivan I.,
Coppens Philip
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505014561
Subject(s) - diffraction , cluster (spacecraft) , displacement (psychology) , basis (linear algebra) , distribution (mathematics) , molecular physics , statistical physics , computational physics , materials science , atomic physics , physics , optics , chemistry , mathematics , geometry , mathematical analysis , computer science , psychology , psychotherapist , programming language
Expressions for the random‐distribution and cluster‐formation models for light‐induced changes in crystals studied by time‐resolved diffraction are presented. The two models can be distinguished on the basis of differences in the predicted intensities. The light‐induced increase in the atomic displacement parameters is analyzed with both simulated and experimental data sets.