Open AccessImproving the performance of high‐resolution X‐ray spectrometers with position‐sensitive pixel detectors
Author(s) -
Monaco G.,
Albergamo F.,
Ponchut C.,
Graafsma H.,
Huotari S.,
Verbeni R.,
Vankó Gy.,
Henriquet C.
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505010630
Subject(s) - spectrometer , optics , detector , spectrum analyzer , resolution (logic) , pixel , dispersion (optics) , compensation (psychology) , position (finance) , signal (programming language) , physics , cube (algebra) , materials science , image resolution , computer science , geometry , psychology , mathematics , finance , artificial intelligence , psychoanalysis , economics , programming language
A dispersion‐compensation method to remove the cube‐size effect from the resolution function of diced analyzer crystals using a position‐sensitive two‐dimensional pixel detector is presented. For demonstration, a resolution of 23 meV was achieved with a spectrometer based on a 1 m Rowland circle and a diced Si(555) analyzer crystal in a near‐backscattering geometry, with a Bragg angle of 88.5°. In this geometry the spectrometer equipped with a traditional position‐insensitive detector provides a resolution of 190 meV. The dispersion‐compensation method thus allows a substantial increase in the resolving power without any loss of signal intensity.