Open AccessDiamond thermal expansion measurement using transmitted X‐ray back‐diffraction
Author(s) -
Adriano Cris,
Cusatis Cesar,
Mazzaro Irineu,
Giles Carlos,
Freire Lubambo Adriana,
Goncalves Hönnicke Marcelo
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049505003432
Subject(s) - thermal expansion , diamond , diffraction , x ray , materials science , x ray crystallography , optics , physics , composite material
The linear thermal expansion coefficient of diamond has been measured using forward‐diffracted profiles in X‐ray backscattering. This experimental technique is presented as an alternative way of measuring thermal expansion coefficients of solids in the high‐resolution Bragg backscattering geometry without the intrinsic difficulty of detecting the reflected beam. The temperature dependence of the lattice parameter is obtained from the high sensitivity of the transmitted profiles to the Bragg angle variation with temperature. The large angular width of the backscattering profiles allows the application of this technique to mosaic crystals with high resolution. As an application of this technique the thermal expansion coefficient of a synthetic type‐Ib diamond (110) single crystal was measured from 10 to 300 K. Extremely low values (of the order of 1 × 10 −7 ± 5 × 10 −7 ) for the linear thermal expansion coefficient in the temperature range from 30 to 90 K are in good agreement with other reported measurements.