
Specimen charging in X‐ray absorption spectroscopy: correction of total electron yield data from stabilized zirconia in the energy range 250–915 eV
Author(s) -
Vlachos Dimitrios,
Craven Alan J.,
McComb David W.
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049504030146
Subject(s) - xanes , range (aeronautics) , absorption (acoustics) , spectroscopy , materials science , yield (engineering) , analytical chemistry (journal) , electron , cubic zirconia , x ray , x ray spectroscopy , graphite , atomic physics , chemistry , optics , physics , nuclear physics , composite material , ceramic , chromatography , quantum mechanics
The effects of specimen charging on X‐ray absorption spectroscopy using total electron yield have been investigated using powder samples of zirconia stabilized by a range of oxides. The stabilized zirconia powder was mixed with graphite to minimize the charging but significant modifications of the intensities of features in the X‐ray absorption near‐edge fine structure (XANES) still occurred. The time dependence of the charging was measured experimentally using a time scan, and an algorithm was developed to use this measured time dependence to correct the effects of the charging. The algorithm assumes that the system approaches the equilibrium state by an exponential decay. The corrected XANES show improved agreement with the electron energy‐loss near‐edge fine structure obtained from the same samples.