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On the imaging of the flux‐line lattice of a type‐II superconductor by soft X‐ray absorption microscopy
Author(s) -
Fähnle M.,
Albrecht J.,
Eimüller T.,
Fischer P.,
Goering E.,
Steiauf D.,
Schütz G.
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049504028936
Subject(s) - superconductivity , lattice (music) , flux (metallurgy) , microscopy , type ii superconductor , condensed matter physics , physics , line (geometry) , x ray , flux pinning , optics , parameter space , microscope , materials science , computational physics , high temperature superconductivity , mathematics , geometry , acoustics , metallurgy
A new method is proposed for the imaging of the flux‐line lattice of a type‐II superconductor by soft X‐ray absorption microscopy. It is shown that the method is very demanding but probably realisable in the foreseeable future. The new method has the potential to image in real space static and dynamical properties of the flux‐line lattice at arbitrary external fields and with single‐flux‐line resolution.

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