Open AccessAn X‐ray nanodiffraction technique for structural characterization of individual nanomaterials
Author(s) -
Xiao Y.,
Cai Z.,
Wang Z. L.,
Lai B.,
Chu Y. S.
Publication year - 2005
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049504028596
Subject(s) - advanced photon source , beamline , characterization (materials science) , synchrotron radiation , optics , synchrotron , synchrotron radiation source , materials science , brightness , diffraction , photon , nanomaterials , x ray , optoelectronics , nanotechnology , physics , beam (structure)
An X‐ray micro/nanodiffraction technique that allows structural characterization of individual nanomaterials has been developed at an insertion‐device beamline of the Advanced Photon Source. Using the extremely high brightness of the third‐generation synchrotron radiation source and advanced high‐resolution high‐energy zone‐plate focusing optics, X‐rays of energies from 6 to 12 keV have been focused into a spot smaller than 200 nm with a photon density gain of more than 50000 so that significant photon flux can be intercepted by a nanoscale material to generate a measurable diffraction signal for structural characterization. This paper describes the instrumentation of the technique and discusses the application of the technique to studies of tin oxide nanobelts.