The partial Talbot effect and its use in measuring the coherence of synchrotron X‐rays

The Talbot effect is the self‐imaging, at distances D multiple of D R , of the intensity downstream of a periodic object. Earlier work with hard synchrotron radiation X‐rays showed the variation with D of the fundamental Fourier component of intensity to be a good measurement of beam coherence. Any higher‐order Fourier coefficients ( D ,  m > 1) would be periodic with a reduced period D R m = D R / m for an ideally coherent incident beam (partial Talbot effect). The degree of coherence γ( x ) is sampled through the ratio of ( D ,  m ) at D = 0 and multiples of D R m . This requires the Fourier coefficient for D = 0, which is not accessible for a phase object (no contrast at D = 0). However, the ratio of the slopes of ( D ,  m ) at D = 0 and D = pD R m also provides this information. Furthermore, a characterization of γ( x ) is possible, provided an assumption is made on its shape, using only the ratio of the Fourier coefficient ( D ,  m ) of two images a distance pD R m apart. Experiments with one‐ and two‐dimensional phase gratings and a mixed (amplitude and phase) two‐dimensional grating confirm that the partial Talbot effect approach is viable. It requires a reduced range of distances, and yields important results directly, obviating the need for computer fits. In particular, 8% of the beam intensity was found to have very low coherence in the vertical direction, probably due to monochromator imperfection.