Open AccessPrediction of the transmission through thin‐film waveguides for X‐ray microscopy
Author(s) -
Jark Werner,
Di Fonzo Silvia
Publication year - 2004
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049504016826
Subject(s) - optics , collimated light , beam (structure) , materials science , synchrotron radiation , transmission (telecommunications) , microscopy , x ray optics , thin film , waveguide , synchrotron , diffraction , beam divergence , physics , laser , x ray , laser beam quality , laser beams , computer science , nanotechnology , telecommunications
Thin‐film slab waveguides can confine incident X‐ray beams in one direction in guiding layers as thin as 10 nm. Consequently they can provide attractive beam dimensions for microscopy purposes. This report presents a simple model and analytical equations for the transmission calculation, which provide results consistent with the rigorous calculations based on recursion techniques. By using these results the waveguide transmission can be compared directly with other microscopy objectives. Ideally X‐ray waveguides can filter the spatially coherent content out of an incident radiation beam with an efficiency of 1. The transmissions measured for state‐of‐the‐art one‐ and two‐dimensional waveguides are found to correspond to experimental efficiencies of 0.5 for each confinement direction. Waveguides with thinner guiding layers cannot be used efficiently in highly collimated beams; instead the beam divergence in unfocused beamlines at state‐of‐the‐art synchrotron radiation sources may eventually have to be increased to the larger angular acceptance of these waveguides by use of other focusing optics.