Open AccessAn apparatus for temperature‐dependent soft X‐ray resonant magnetic scattering
Author(s) -
Jaouen Nicolas,
Tonnerre JeanMarc,
Kapoujian Grigor,
Taunier Pierre,
Roux JeanPaul,
Raoux Denis,
Sirotti Fausto
Publication year - 2004
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049504013767
Subject(s) - diffractometer , scattering , materials science , phase (matter) , optics , x ray , physics , scanning electron microscope , quantum mechanics
Interest in the use of soft X‐ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature‐dependent soft X‐ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.