Open AccessPerformance of a cryogenic silicon monochromator under extreme heat load
Author(s) -
Chumakov Aleksandr,
Rüffer Rudolf,
Leupold Olaf,
Celse JeanPhilippe,
Martel Keith,
Rossat Michel,
Lee WahKeat
Publication year - 2004
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049503026785
Subject(s) - monochromator , silicon , materials science , optics , crystal (programming language) , range (aeronautics) , power density , monocrystalline silicon , beam (structure) , heat load , heat flux , irradiance , power (physics) , optoelectronics , physics , heat transfer , thermodynamics , composite material , wavelength , computer science , programming language
The performance of an indirectly cooled cryogenic silicon monochromator under heat loads up to 870 W has been studied. The investigation was performed over numerous parameters and included measurements of total flux, spectral density, rocking curves, angular beam profiles and crystal slope errors. An almost ideal monochromator performance was observed in the 270–570 W range of the heating power. At a heat load of ∼400 W and under standard operation conditions, the crystal distortions did not exceed 1 µrad. At the highest available heat load of 870 W, the crystal distortions were about 7 µrad.