Open AccessRay‐tracing analysis of diffractive–refractive X‐ray optics
Author(s) -
Artemiev Nikolay,
Hrdý Jaromir,
Peredkov Serguei,
Artemev Alexander
Publication year - 2004
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049503023343
Subject(s) - ray tracing (physics) , optics , lens (geology) , x ray optics , diffraction , physics , crystal (programming language) , distributed ray tracing , geometrical optics , collimated light , x ray , computer science , laser , programming language
Ray‐tracing simulations of mistuned sagittal diffractive–refractive X‐ray lenses (DRXL) are presented. In this article, firstly the characteristic aberrations for various types of crystal misalignments within one‐crystal and four‐crystal DRXLs are considered, and the sensitivity of such an optical system to the mutual misalignment of its components is discussed. The simulations reveal that a DRXL is not too sensitive to the adjustment of its components. In the second part of this article the performance of such lenses with ideal and approximate profiles is examined. Comparative analysis of parabolic and cylindrical DRXLs showed that, in the case when the linear source size is comparable with the acceptance of the lens, the performances of parabolic and cylindrical DRXLs are practically the same.