Open AccessFirst experiments on diffraction‐enhanced imaging at LNLS
Author(s) -
Giles C.,
Hönnicke M. G.,
Lopes R. T.,
Rocha H. S.,
Gonçalves O. D.,
Mazzaro I.,
Cusatis C.
Publication year - 2003
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049503020144
Subject(s) - beamline , optics , diffraction , materials science , synchrotron , bragg's law , beam (structure) , crystal (programming language) , detector , reflection (computer programming) , silicon , diffraction topography , physics , optoelectronics , computer science , programming language
Diffraction‐enhanced images have been obtained using two silicon crystals in a non‐dispersive set‐up at the XRD2 beamline at the Brazilian Synchrotron Light Laboratory (LNLS). A first asymmetrically cut silicon crystal using the (333) reflection vertically expanded the monochromated beam from 1 mm to 20 mm allowing the imaging of the whole sample without movements. A symmetrically cut Si(333) second crystal was used as a Bragg analyzer. Images of biological samples including human tissue were recorded using a direct‐conversion CCD detector resulting in enhancement of the contrast compared with absorption‐contrast images.