Open AccessIntegrating near‐edge X‐ray absorption fine structure (NEXAFS) microscopy and crystallography: the effects of molecular order
Author(s) -
Croll Lisa M.,
Britten James F.,
Morin Cynthia,
Hitchcock Adam P.,
Stöver Harald D. H.
Publication year - 2003
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049503004497
Subject(s) - xanes , crystallography , microscopy , linear dichroism , absorption (acoustics) , materials science , absorption spectroscopy , single crystal , dichroism , crystal structure , polarized light microscopy , chemistry , optics , spectral line , circular dichroism , physics , astronomy , composite material
The carbon K ‐edge near‐edge X‐ray absorption spectra (NEXAFS) of oriented single crystals of N , N ′′‐ethylenebis( N ′‐2‐methylphenyl)urea have been recorded using scanning transmission X‐ray microscopy (STXM). The single‐crystal structure has been determined by X‐ray crystallography. A strong polarization dependence (linear dichroism) has been observed and interpreted with the aid of the single‐crystal structure and crystal alignment. These results demonstrate the ability of STXM to determine molecular orientation on a submicrometre spatial scale.