X‐ray diffraction topography using a diffractometer with a bendable monochromator at a synchrotron radiation source | Zendy

Altin D. | Zendy; Härtwig J. | Zendy; Köhler R. | Zendy; Ludwig W. | Zendy; Ohler M. | Zendy; Klein H. | Zendy

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X‐ray diffraction topography using a diffractometer with a bendable monochromator at a synchrotron radiation source

Author(s) -

Altin D.,

Härtwig J.,

Köhler R.,

Ludwig W.,

Ohler M.,

Klein H.

Publication year - 2002

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049502010294

Subject(s) - monochromator , diffractometer , optics , synchrotron radiation , synchrotron , materials science , diffraction , x ray , synchrotron radiation source , bragg's law , dispersion (optics) , realization (probability) , physics , wavelength , scanning electron microscope , statistics , mathematics

The different properties of laboratory‐ and synchrotron‐based double‐crystal setups for X‐ray topographic applications are discussed as a basis for the realization of a versatile instrument allowing the investigation of all kinds of crystals with high strain sensitivity and without any reduction in image size. It appears that the use of a bendable highly perfect monochromator (silicon) achieves this goal, through the local adaptation of Bragg angles, to compensate either dispersion or a bending of the sample.

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