Open AccessX‐ray diffraction topography using a diffractometer with a bendable monochromator at a synchrotron radiation source
Author(s) -
Altin D.,
Härtwig J.,
Köhler R.,
Ludwig W.,
Ohler M.,
Klein H.
Publication year - 2002
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049502010294
Subject(s) - monochromator , diffractometer , optics , synchrotron radiation , synchrotron , materials science , diffraction , x ray , synchrotron radiation source , bragg's law , dispersion (optics) , realization (probability) , physics , wavelength , scanning electron microscope , statistics , mathematics
The different properties of laboratory‐ and synchrotron‐based double‐crystal setups for X‐ray topographic applications are discussed as a basis for the realization of a versatile instrument allowing the investigation of all kinds of crystals with high strain sensitivity and without any reduction in image size. It appears that the use of a bendable highly perfect monochromator (silicon) achieves this goal, through the local adaptation of Bragg angles, to compensate either dispersion or a bending of the sample.