Open AccessA new bend‐magnet beamline for scanning transmission X‐ray microscopy at the Advanced Light Source
Author(s) -
Ade Harald,
Warwick Tony,
Kilcoyne David,
Kritscher Michael,
Tylisczcak Tolek,
Fakra Sirine,
Hitchcock Adam,
Hitchcock Peter,
Padmore Howard
Publication year - 2002
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049502005502
Subject(s) - beamline , undulator , optics , synchrotron radiation , synchrotron , microscope , advanced photon source , synchrotron light source , brightness , materials science , microscopy , magnet , physics , beam (structure) , storage ring , quantum mechanics
The high brightness of the bend magnets at the Advanced Light Source has been exploited to illuminate a scanning transmission X‐ray microscope (STXM). This is the first diffraction‐limited scanning X‐ray microscope to operate with a useful count rate on a synchrotron bend‐magnet source. A simple dedicated beamline has been built covering the range of photon energy from 250 eV to 600 eV. The beamline is always available and needs little adjustment. Use of this facility is much easier than that of installations that share undulator beams. This facility provides radiation for C 1 s , N 1 s and O 1 s near‐edge X‐ray absorption spectromicroscopy with STXM count rates in excess of 1 MHz and with spectral resolution typically 1:2000, limited to about 1:5000.