Open AccessQuantitative analysis of two‐component samples using in‐line hard X‐ray images
Author(s) -
Gureyev T. E.,
Stevenson A. W.,
Paganin D. M.,
Weitkamp T.,
Snigirev A.,
Snigireva I.,
Wilkins S. W.
Publication year - 2002
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049502004971
Subject(s) - component (thermodynamics) , position (finance) , line (geometry) , image resolution , detector , synchrotron , x ray , synchrotron radiation , phase (matter) , optics , sample (material) , resolution (logic) , image processing , materials science , physics , computer science , image (mathematics) , artificial intelligence , mathematics , geometry , finance , quantum mechanics , economics , thermodynamics
Methods for rapid quantitative phase‐sensitive X‐ray imaging of non‐crystalline samples consisting of two distinct components are investigated. The transverse spatial distribution of the projected thickness of each component is reconstructed by computer processing of in‐line images collected using synchrotron‐generated hard X‐rays and a position‐sensitive detector with submicrometre spatial resolution. Different imaging techniques and associated image‐processing algorithms are considered, with relative advantages and difficulties of each approach compared. A possible generalization of the method for the case of n ‐component samples is briefly discussed.