Open AccessZernike‐type phase‐contrast hard X‐ray microscope with a zone plate at the Photon Factory
Author(s) -
Yokosuka Hiroki,
Watanabe Norio,
Ohigashi Takuji,
Yoshida Yasutoshi,
Maeda Shunichi,
Aoki Sadao,
Suzuki Yoshio,
Takeuchi Akihisa,
Takano Hidekazu
Publication year - 2002
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049502004211
Subject(s) - monochromatic color , optics , microscope , zone plate , zernike polynomials , materials science , phase (matter) , contrast (vision) , phase contrast microscopy , phase contrast imaging , photon , physics , diffraction , wavefront , quantum mechanics
A Zernike‐type phase‐contrast X‐ray microscope with a zone plate and a phase plate was constructed at the Photon Factory BL3C2. Parallel monochromatic X‐rays of 8.97 keV were incident on a specimen and a direct beam transmitted through the specimen was focused on the back focal plane of the zone plate, where an aluminium phase plate was placed. Tantalum line patterns as fine as 0.3 µm could be imaged. Phase‐contrast images of polypropylene wires and polystyrene latex beads were obtained, which showed better contrast than that of their bright field images.