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High‐resolution hard X‐ray phase‐contrast microscopy with a large‐diameter and high‐numerical‐aperture zone plate
Author(s) -
Kagoshima Yasushi,
Yokoyama Yoshiyuki,
Ibuki Takashi,
Niimi Toshihiro,
Tsusaka Yoshiyuki,
Takai Kengo,
Matsui Junji
Publication year - 2002
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049502003758
Subject(s) - zone plate , optics , materials science , beamline , microscopy , microscope , phase (matter) , advanced photon source , aperture (computer memory) , resolution (logic) , beam (structure) , physics , diffraction , quantum mechanics , artificial intelligence , computer science , acoustics
An imaging transmission hard X‐ray microscope has been con­structed at beamline BL24XU of SPring‐8. It makes use of a phase zone plate made of tantalum with a diameter of 1 mm and an outer‐most zone width of 50 nm, aiming at a wide field of view and a high spatial resolution. The performance test was carried out at a photon energy of 10 keV. A field of view as wide as ∼200 µm in diameter was achieved. The spatial resolution was measured to be 220 nm by analyzing a knife‐edge image. Further, a line‐and‐space pattern as fine as 100 nm could be imaged. By placing a phase plate made of gold in the back focal plane of the zone plate, phase‐contrast microscopy using Zernike's method was also carried out. The feasibility of phase‐contrast microscopy for observing transparent samples was successfully demonstrated by imaging small polystyrene particles.

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