Open AccessNew opportunities in trace elements structural characterization: high‐energy X‐ray absorption near‐edge structure spectroscopy
Author(s) -
Chaboy J.,
Cotallo E.,
Quartieri S.,
Boscherini F.
Publication year - 2002
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049502002327
Subject(s) - xanes , characterization (materials science) , spectroscopy , trace (psycholinguistics) , mafic , ultramafic rock , x ray absorption spectroscopy , absorption (acoustics) , absorption spectroscopy , chemistry , materials science , analytical chemistry (journal) , geology , geochemistry , nanotechnology , optics , physics , environmental chemistry , linguistics , philosophy , quantum mechanics , composite material
Garnets in lower crustal mafic and ultramafic rocks usually contain rare‐earth elements (REE) in trace concentrations. Direct characterization of REE at trace levels in natural garnets is not available in the literature because of the difficulty of obtaining structural information by means of conventional diffraction methods. Here, the characterization of Nd at trace levels (176–1029 p.p.m.) in a set of natural garnets performed by means of Nd K ‐edge X‐ray absorption near‐edge structure spectroscopy is presented, showing the capability of high‐energy XANES for REE in trace structural determinations.