Open AccessReconstruction of magnetization density in two‐dimensional samples from soft X‐ray speckle patterns using the multiple‐wavelength anomalous diffraction method
Author(s) -
Menteş T. O.,
SánchezHanke C.,
Kao C. C.
Publication year - 2002
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049502001310
Subject(s) - scattering , diffraction , wavelength , optics , amplitude , magnetic domain , polarization (electrochemistry) , materials science , magnetization , speckle pattern , physics , absorption (acoustics) , condensed matter physics , magnetic field , chemistry , quantum mechanics
A non‐destructive technique for imaging magnetic domains in thin films and two‐dimensional magnetic structures using coherent soft X‐ray scattering and the multiple‐wavelength anomalous diffraction method (MAD) is proposed. The method exploits the strong energy dependence in the magnetic scattering amplitude for 3 d transition metals near the L absorption edges and 4 f elements near the M absorption edges. The phase information required in the reconstruction algorithm is derived from the interference between the charge and magnetic scattering amplitudes. Magnetic speckle patterns from the magnetic domain distribution in an artificially defined Fe thin film are used to demonstrate this reconstruction algorithm. Circularly and linearly polarized incident light are examined separately to investigate the effect of polarization on the capability of the method.