Open AccessHigh‐sensitivity CCD‐based X‐ray detector
Author(s) -
Phillips Walter C.,
Stewart Alexander,
Stanton Martin,
Naday Istvan,
Ingersoll Charles
Publication year - 2002
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049501020143
Subject(s) - optics , physics , pixel , detector , image resolution , dynamic range , sensitivity (control systems) , x ray detector , photon , dot pitch , noise (video) , image sensor , photon counting , resolution (logic) , time delay and integration , image (mathematics) , computer science , computer vision , artificial intelligence , electronic engineering , engineering
The detector is designed for imaging measurements requiring relatively high sensitivity and high spatial resolution. The detector can discriminate single X‐ray photons, yet has the wide dynamic range (∼10000:1) associated with integrating detectors. A GdO 2 S 2 phosphor screen converts the incoming X‐ray image into an optical image. The optical image is coupled (without demagnification) to the CCD image sensor using a fiber optic faceplate. The CCD (Philips Semiconductors) has an area of 4.9 × 8.6 cm with 4000 × 7000 12 µm pixels. A single 12 keV X‐ray photon produces a signal of 100 e − . With 2 × 2 pixel binning, the total noise per 24 µm pixel in a 100 s image is ∼30 e − , the detective quantum efficiency is >0.6 at 1 X‐ray photon per pixel, and the full image can be read out in <4 s. The spatial resolution is 50 µm. The CCD readout system is fully computer‐controlled, allowing flexible operation in time‐resolved experiments. The detector has been characterized using visible‐light images, X‐ray images and time‐resolved muscle diffraction measurements.