Open AccessThe XMaS beamline at ESRF: instrumental developments and high‐resolution diffraction studies
Author(s) -
Brown S. D.,
Bouchenoire L.,
Bowyer D.,
Kervin J.,
Laundy D.,
Longfield M. J.,
Mannix D.,
Paul D. F.,
Stunault A.,
Thompson P.,
Cooper M. J.,
Lucas C. A.,
Stirling W. G.
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049501015394
Subject(s) - beamline , optics , diffractometer , instrumentation (computer programming) , diffraction , powder diffractometer , physics , monochromatic color , polarization (electrochemistry) , materials science , beam (structure) , chemistry , scanning electron microscope , computer science , operating system
The beamline, which is situated on a bending magnet at ESRF, comprises a unique combination of instrumentation for high‐resolution and magnetic single‐crystal diffraction. White‐beam operation is possible, as well as focused and unfocused monochromatic modes. In addition to an eleven‐axis Huber diffractometer, which facilitates simple operation in both vertical and horizontal scattering geometries, there is an in‐vacuum polarization analyser and slit system, mirrors for harmonic rejection, sub 4.2 K and 1 Tesla magnetic field sample environment, plus a diamond phase plate for polarization conditioning. The instrumentation developed specifically for this beamline is described, and its use illustrated by recent scientific results.