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A compact optical design for Bragg reflections near backscattering
Author(s) -
Baron Alfred Q. R.,
Tanaka Yoshikazu,
Ishikawa Daisuke,
Miwa Daigo,
Yabashi Makina,
Ishikawa Tetsuya
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049501010901
Subject(s) - monochromator , optics , bragg's law , physics , scattering , photon , bragg peak , coherent backscattering , reflection (computer programming) , beam (structure) , materials science , diffraction , computer science , wavelength , programming language
A very compact in‐line X‐ray optical design is presented which is optimized for use with Bragg reflections close to backscattering (Bragg angles near 90°). The essential idea is to use a low‐order Bragg reflection to couple the X‐ray beam into a small channel‐cut backscattering crystal. The design is demonstrated in an almost theoretically performing high‐resolution monochromator providing 2 × 10 8 photons s −1 in a 0.52 meV bandwidth at 25.65 keV. The monochromator is used to measure inelastic nuclear scattering from phonons in 161 Dy‐containing samples.

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