Open AccessX‐ray absorption spectroscopy study of Co structure in the epitaxial Co/Pt multilayers on Al 2 O 3 (11‐20) substrates
Author(s) -
Lee ChihHao,
Yu KuanLi,
Cheng PeiYu,
Huang J. C. A.,
Pong W. F.
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049501000887
Subject(s) - x ray absorption spectroscopy , extended x ray absorption fine structure , materials science , spectroscopy , epitaxy , x ray spectroscopy , x ray absorption fine structure , x ray , absorption (acoustics) , crystallography , absorption spectroscopy , analytical chemistry (journal) , x ray photoelectron spectroscopy , chemistry , nanotechnology , nuclear magnetic resonance , optics , physics , layer (electronics) , quantum mechanics , chromatography , composite material
In this study, five epitaxial [Co(t nm)/Pt(1 nm)] 30 multilayer samples (t=0.16‐1.07 nm) were studied using polarized X‐ray absorption spectroscopy method. These samples were prepared on Mo(110)/ Al 2 O 3 (11‐20) substrates by MBE technique. The results show that the Co layer is more like an fcc pseudomorphic structure for the Co thickness of less than 0.3 nm. For Co layer thickness of 1 nm, the first shell distance is 0.25 nm, which is very close to the Co‐Co distance of bulk hcp Co. On the other hand, for Co layer of less than 0.3 nm, the in plane first shell distance is expanded by 4% and most of the neighboring atoms are Pt atoms. The fitting results of the Co/Pt multilayers seem to support a sharp boundary model rather than an interdiffusion model.