Open AccessXAFS study on a pressure‐induced superconductor Cs 3 C 60 under high pressure
Author(s) -
Fujiki Satoshi,
Kubozono Yoshihiro,
Takabayashi Yasuhiro,
Kashino Setsuo,
Emura Shuichi
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049501000218
Subject(s) - x ray absorption fine structure , superconductivity , diamond anvil cell , high pressure , diffraction , materials science , xanes , diamond , crystallography , chemistry , analytical chemistry (journal) , condensed matter physics , spectroscopy , thermodynamics , physics , optics , metallurgy , chromatography , quantum mechanics
Cs K‐edge XAFS of Cs 3 C 60 which is a pressure‐induced superconductor were measured at 21 and 34 kbar by using a diamond anvil cell (DAC) in order to obtain the structural information under high pressure, and to clarify the origin of the pressure‐induced superconductivity. The distances and the mean square displacements between the Cs and C atoms are consistent with those determined by X‐ray powder diffraction. Consequently, the high‐pressure XAFS can give the reliable structural‐information on a fullerene superconductor under high pressure. We also show the procedure of the analysis of high‐pressure XAFS with DAC in detail.