Open AccessThickness inhomogeneity and fluorescence effects in EXAFS spectroscopy for powder samples: solution of the inverse problem
Author(s) -
Ryazhkin Anton,
Babanov Yu.,
Miyanaga Takafumi
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500020926
Subject(s) - extended x ray absorption fine structure , materials science , absorption (acoustics) , fluorescence , analytical chemistry (journal) , spectral line , k edge , spectroscopy , absorption spectroscopy , inverse , surface extended x ray absorption fine structure , x ray absorption spectroscopy , fluorescence spectroscopy , molecular physics , chemistry , optics , physics , chromatography , geometry , mathematics , quantum mechanics , astronomy , composite material
For thin powder samples EXAFS spectra are often suffered from thickness inhomogeneity and for thick samples from fluorescence at energies above edge absorption. As a result EXAFS amplitude is decreased and information about the coordination numbers is distorted. For correction of x‐ray absorption spectra on inhomogeneity and fluorescence effects we propose a new method of solving an inverse problem. Model calculations are carried out. This method is applied to preliminary processing EXAFS spectra for Ni‐Mn alloys.