Open AccessLinear combination of XANES for quantitative analysis of Ti–Si binary oxides
Author(s) -
Lee Jae Sung,
Kim Won Bae,
Choi Sun Hee
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500020331
Subject(s) - xanes , materials science , molecular sieve , mesoporous material , oxide , titanium , absorption (acoustics) , binary number , spectral line , analytical chemistry (journal) , chemistry , metallurgy , adsorption , catalysis , composite material , organic chemistry , physics , arithmetic , mathematics , astronomy
A new method is demonstrated for the quantification of Ti—O—Si and Ti—O—Ti bonds in Ti–Si binary oxides. It is based on the linear combination of two reference X‐ray absorption near‐edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti—O—Si reference material is most important for the successful application of this method. Three Ti–Si binary oxide systems have been analysed by the new method: Ti–Si mixed oxides, titania supported on silica and Ti‐substituted MCM‐41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents.